"Naïve Bayes classifier based on reliability measurement for datasets ..."

Yingqiu Zhu et al. (2025)

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DOI: 10.1007/S10479-023-05671-1

access: closed

type: Journal Article

metadata version: 2025-07-06

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Yingqiu Zhu, Yinzhi Wang, Lei Qin, Bo Zhang, Ben-Chang Shia, Mingchih Chen:
Naïve Bayes classifier based on reliability measurement for datasets with noisy labels. Ann. Oper. Res. 349(1): 259-286 (2025)

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