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"An exploration of combinatorial testing-based approaches to fault ..."

Ludwig Kampel et al. (2022)

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DOI: 10.1007/S10472-021-09772-0

access: closed

type: Journal Article

metadata version: 2022-11-18

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Ludwig Kampel, Dimitris E. Simos, D. Richard Kuhn, Raghu N. Kacker:
An exploration of combinatorial testing-based approaches to fault localization for explainable AI. Ann. Math. Artif. Intell. 90(7-9): 951-964 (2022)

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