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"Predicting Atomic Force Microscopy Topography from Optical Microscopes ..."

Jaewoo Jeong et al. (2023)

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DOI: 10.1002/AISY.202370003

access: open

type: Journal Article

metadata version: 2023-02-25

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  - https://dblp.org/rec/journals/aisy/JeongKLL23
Jaewoo Jeong, Taeyeong Kim, Bong Jae Lee, Jungchul Lee:
Predicting Atomic Force Microscopy Topography from Optical Microscopes Using Deep Learning. Adv. Intell. Syst. 5(1) (2023)

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