"IGBT Junction Temperature Measurement Under Active-Short-Circuit and ..."

Yuan Zhu et al. (2020)

> Home

Details and statistics

DOI: 10.1109/ACCESS.2020.3003654

access: open

type: Journal Article

metadata version: 2024-09-11

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/access/ZhuXXLWY20
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/access/ZhuXXLWY20
Yuan Zhu, Mingkang Xiao, Su Xiezu, Ke Lu, Zhihong Wu, Gang Yang:
IGBT Junction Temperature Measurement Under Active-Short-Circuit and Locked-Rotor Modes in New Energy Vehicles. IEEE Access 8: 114401-114412 (2020)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.