Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Crack Defect Detection Processing Algorithm and Method of MEMS Devices ..."

Yu Zheng et al. (2023)

> Home

Details and statistics

DOI: 10.1109/ACCESS.2023.3331152

access: open

type: Journal Article

metadata version: 2023-11-28

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/access/ZhengLXZ23
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/access/ZhengLXZ23
Yu Zheng, Susu Li, Yuan Xiang, Zhenxing Zhu:
Crack Defect Detection Processing Algorithm and Method of MEMS Devices Based on Image Processing Technology. IEEE Access 11: 126323-126334 (2023)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.