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"A Defect Detection Method for the Image With Intersecting Feature."

Weiqi Yuan, Yang Liu (2020)

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DOI: 10.1109/ACCESS.2020.2993249

access: open

type: Journal Article

metadata version: 2020-12-17

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  dblp key:
  - journals/access/YuanL20
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  - https://dblp.org/rec/journals/access/YuanL20
Weiqi Yuan, Yang Liu:
A Defect Detection Method for the Image With Intersecting Feature. IEEE Access 8: 87842-87856 (2020)

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