Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Impact of P/E Stress on Trap Profiles in Bandgap-Engineered Tunneling ..."

Gilsang Yoon et al. (2022)

> Home

Details and statistics

DOI: 10.1109/ACCESS.2022.3182397

access: open

type: Journal Article

metadata version: 2023-12-26

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/access/YoonKPKKL22
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/access/YoonKPKKL22
Gilsang Yoon, Donghyun Go, Jounghun Park, Donghwi Kim, Jungsik Kim, Jeong-Soo Lee:
Impact of P/E Stress on Trap Profiles in Bandgap-Engineered Tunneling Oxide of 3D NAND Flash Memory. IEEE Access 10: 62423-62428 (2022)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.