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"A Study of Transient Voltage Peaking in Diode-Based ESD Protection ..."

Chenkun Wang et al. (2020)

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DOI: 10.1109/ACCESS.2020.2992496

access: open

type: Journal Article

metadata version: 2024-02-27

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  - https://dblp.org/rec/journals/access/WangZLCLW20
Chenkun Wang, Feilong Zhang, Fei Lu, Qi Chen, Cheng Li, Albert Z. Wang:
A Study of Transient Voltage Peaking in Diode-Based ESD Protection Structures in 28nm CMOS. IEEE Access 8: 87164-87172 (2020)

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