"Sequential Detection of Image Defects for Patterned Fabrics."

Wenzhen Wang, Na Deng, Binjie Xin (2020)

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DOI: 10.1109/ACCESS.2020.3024695

access: open

type: Journal Article

metadata version: 2021-09-16

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Wenzhen Wang, Na Deng, Binjie Xin:
Sequential Detection of Image Defects for Patterned Fabrics. IEEE Access 8: 174751-174762 (2020)

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