"Reliability Evaluation of Multi-Mechanism Failure for Semiconductor ..."

Bo Wan et al. (2020)

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DOI: 10.1109/ACCESS.2020.3031022

access: open

type: Journal Article

metadata version: 2021-09-23

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Bo Wan, Ye Wang, Yutai Su, Guicui Fu:
Reliability Evaluation of Multi-Mechanism Failure for Semiconductor Devices Using Physics-of-Failure Technique and Maximum Entropy Principle. IEEE Access 8: 188154-188170 (2020)

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