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"Reduced Pin-Count Test Strategy for 3D Stacked ICs Using Simultaneous ..."

Iftikhar A. Soomro, Mohammad Samie, Ian K. Jennions (2021)

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DOI: 10.1109/ACCESS.2021.3081359

access: open

type: Journal Article

metadata version: 2021-06-01

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  - https://dblp.org/rec/journals/access/SoomroSJ21
Iftikhar A. Soomro, Mohammad Samie, Ian K. Jennions:
Reduced Pin-Count Test Strategy for 3D Stacked ICs Using Simultaneous Bi-Directional Signaling Based Time Division Multiplexing. IEEE Access 9: 75892-75904 (2021)

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