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"Electrical Stability of p-Channel Feedback Field-Effect Transistors Under ..."

Jaemin Son, Kyoungah Cho, Sangsig Kim (2021)

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DOI: 10.1109/ACCESS.2021.3108232

access: open

type: Journal Article

metadata version: 2021-12-15

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Jaemin Son, Kyoungah Cho, Sangsig Kim:
Electrical Stability of p-Channel Feedback Field-Effect Transistors Under Bias Stresses. IEEE Access 9: 119402-119405 (2021)

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