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"Wafer Defect Localization and Classification Using Deep Learning Techniques."

Prashant P. Shinde, Priyadarshini P. Pai, Shashishekar P. Adiga (2022)

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DOI: 10.1109/ACCESS.2022.3166512

access: open

type: Journal Article

metadata version: 2022-04-27

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  dblp key:
  - journals/access/ShindePA22
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  - https://dblp.org/rec/journals/access/ShindePA22
Prashant P. Shinde, Priyadarshini P. Pai, Shashishekar P. Adiga:
Wafer Defect Localization and Classification Using Deep Learning Techniques. IEEE Access 10: 39969-39974 (2022)

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