default search action
"An Investigation of Electric Field and Breakdown Voltage Models for a Deep ..."
Tao Liu et al. (2019)
- Tao Liu, Shengdong Hu, Jian-an Wang, Gang Guo, Jun Luo, Yuan Wang, Jingwei Guo, Yanmeng Huo:
An Investigation of Electric Field and Breakdown Voltage Models for a Deep Trench Superjunction SiC VDMOS. IEEE Access 7: 145118-145123 (2019)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.