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"Time-Variant Reliability Optimization for Stress Balance in Press-Pack ..."

Hangyang Li et al. (2023)

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DOI: 10.1109/ACCESS.2023.3313504

access: open

type: Journal Article

metadata version: 2023-10-14

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  - https://dblp.org/rec/journals/access/LiYLZMZX23
Hangyang Li, Tongguang Yang, Xinglin Liu, Jingyi Zhong, Jiaxin Mo, Han Zhou, Zhongkun Xiao:
Time-Variant Reliability Optimization for Stress Balance in Press-Pack Insulated Gate Bipolar Transistors. IEEE Access 11: 98059-98069 (2023)

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