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"A Thermal Failure Model for MOSFETs Under Repetitive Electromagnetic Pulses."

Yong Li et al. (2020)

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DOI: 10.1109/ACCESS.2020.3045621

access: open

type: Journal Article

metadata version: 2021-03-02

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  - https://dblp.org/rec/journals/access/LiXYWY20
Yong Li, Haiyan Xie, Hui Yan, Jianguo Wang, Zhiqiang Yang:
A Thermal Failure Model for MOSFETs Under Repetitive Electromagnetic Pulses. IEEE Access 8: 228245-228254 (2020)

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