Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Analysis of Discharge Faults Between Flanges Caused by Transient Enclosure ..."

Jisheng Li et al. (2020)

> Home

Details and statistics

DOI: 10.1109/ACCESS.2020.2965197

access: open

type: Journal Article

metadata version: 2020-06-18

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/access/LiHWCL20
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/access/LiHWCL20
Jisheng Li, Zeyu He, Yu Wang, Xiaoyue Chen, Yongcong Liu:
Analysis of Discharge Faults Between Flanges Caused by Transient Enclosure Voltage. IEEE Access 8: 10981-10988 (2020)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.