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"Simulation Acceleration of Bit Error Rate Prediction and Yield ..."

Yohan Kim, Soyoung Kim (2023)

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DOI: 10.1109/ACCESS.2023.3309649

access: open

type: Journal Article

metadata version: 2023-09-24

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Yohan Kim, Soyoung Kim:
Simulation Acceleration of Bit Error Rate Prediction and Yield Optimization of 3D V-NAND Flash Memory. IEEE Access 11: 93956-93967 (2023)

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