"Design of a Small NEMP Simulator for the Immunity Test of Core Electronic ..."

Young-Jin Kim et al. (2020)

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DOI: 10.1109/ACCESS.2020.3042262

access: open

type: Journal Article

metadata version: 2021-01-04

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Young-Jin Kim, Young-Kyung Jeong, Dong-Gi Youn, Hyun Ho Park, Yong Bae Park:
Design of a Small NEMP Simulator for the Immunity Test of Core Electronic Components in HEMP Environments. IEEE Access 8: 217773-217780 (2020)

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