"Alteration of Gate-Oxide Trap Capture/Emission Time Constants by Channel ..."

Xin Ju, Diing Shenp Ang (2020)

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DOI: 10.1109/ACCESS.2020.2966577

access: open

type: Journal Article

metadata version: 2020-02-07

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Xin Ju, Diing Shenp Ang:
Alteration of Gate-Oxide Trap Capture/Emission Time Constants by Channel Hot-Carrier Effect in the Metal-Oxide-Semiconductor Field-Effect Transistor. IEEE Access 8: 14048-14053 (2020)

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