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"Contact-Less Integrity Verification of Microelectronics Using Near-Field ..."

Junjun Huan et al. (2023)

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DOI: 10.1109/ACCESS.2023.3300222

access: open

type: Journal Article

metadata version: 2023-08-18

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Junjun Huan, Peyman Dehghanzadeh, Soumyajit Mandal, Swarup Bhunia:
Contact-Less Integrity Verification of Microelectronics Using Near-Field EM Analysis. IEEE Access 11: 80588-80599 (2023)

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