Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Lifetime Prediction of Current-and Temperature-Induced Degradation in ..."

Alexander Herzog et al. (2023)

> Home

Details and statistics

DOI: 10.1109/ACCESS.2023.3249478

access: open

type: Journal Article

metadata version: 2023-03-11

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/access/HerzogBZBDMK23
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/access/HerzogBZBDMK23
Alexander Herzog, Simon Benkner, Babak Zandi, Matteo Buffolo, Willem D. van Driel, Matteo Meneghini, Tran Quoc Khanh:
Lifetime Prediction of Current-and Temperature-Induced Degradation in Silicone-Encapsulated 365 nm High-Power Light-Emitting Diodes. IEEE Access 11: 19928-19940 (2023)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.