"A Naive-Bayes-Based Fault Diagnosis Approach for Analog Circuit by Using ..."

Wei He et al. (2020)

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DOI: 10.1109/ACCESS.2018.2888950

access: open

type: Journal Article

metadata version: 2023-07-10

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Wei He, Yigang He, Bing Li, Chaolong Zhang:
A Naive-Bayes-Based Fault Diagnosis Approach for Analog Circuit by Using Image-Oriented Feature Extraction and Selection Technique. IEEE Access 8: 5065-5079 (2020)

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