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"A Review: Application of Terahertz Nondestructive Testing Technology in ..."

Chenjun Guo et al. (2022)

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DOI: 10.1109/ACCESS.2022.3222860

access: open

type: Journal Article

metadata version: 2022-12-05

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  - https://dblp.org/rec/journals/access/GuoXCDFZ22
Chenjun Guo, Wenlong Xu, Mingming Cai, Shufan Duan, Jianbiao Fu, Xinlong Zhang:
A Review: Application of Terahertz Nondestructive Testing Technology in Electrical Insulation Materials. IEEE Access 10: 121547-121560 (2022)

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