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"Thin-Film Transistor Simulations With the Voltage-In-Current Latency ..."

Wei Chun Chin et al. (2021)

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DOI: 10.1109/ACCESS.2021.3131730

access: open

type: Journal Article

metadata version: 2021-12-15

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  dblp key:
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  - https://dblp.org/rec/journals/access/ChinPSAG21
Wei Chun Chin, Andrei Pashkovich, José E. Schutt-Ainé, Nur Syazreen Ahmad, Patrick Goh:
Thin-Film Transistor Simulations With the Voltage-In-Current Latency Insertion Method. IEEE Access 9: 159334-159348 (2021)

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