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"A Machine Learning Approach to Modeling Intrinsic Parameter Fluctuation of ..."

Rajat Butola, Yiming Li, Sekhar Reddy Kola (2022)

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DOI: 10.1109/ACCESS.2022.3188690

access: open

type: Journal Article

metadata version: 2023-06-26

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Rajat Butola, Yiming Li, Sekhar Reddy Kola:
A Machine Learning Approach to Modeling Intrinsic Parameter Fluctuation of Gate-All-Around Si Nanosheet MOSFETs. IEEE Access 10: 71356-71369 (2022)

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