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"A Big Data Architecture for Fault Prognostics of Electronic Devices: ..."

Carlos J. Alonso-González et al. (2019)

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DOI: 10.1109/ACCESS.2019.2929111

access: open

type: Journal Article

metadata version: 2019-08-21

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  - https://dblp.org/rec/journals/access/Alonso-Gonzalez19a
Carlos J. Alonso-González, Belarmino Pulido, Mario Cartón, Aníbal Bregón:
A Big Data Architecture for Fault Prognostics of Electronic Devices: Application to Power MOSFETs. IEEE Access 7: 102160-102173 (2019)

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