"Reliability Issues and Degradation Mechanisms of p-GaN Gated E-Mode ..."

J. Ajayan et al. (2025)

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DOI: 10.1109/ACCESS.2025.3569288

access: open

type: Journal Article

metadata version: 2025-06-11

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J. Ajayan, Asisa Kumar Panigrahy, Sachidananda Sen, Maneesh Kumar, Shubham Tayal:
Reliability Issues and Degradation Mechanisms of p-GaN Gated E-Mode AlGaN/GaN Power HEMTs: A Critical Review. IEEE Access 13: 84541-84554 (2025)

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