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ORCID"Syndrome Signature in Output Compaction for VLSI Built-in Self-Test."
Sunil R. Das et al. (1998)
- Sunil R. Das, Nita Goel, Wen-Ben Jone, Amiya R. Nayak
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Syndrome Signature in Output Compaction for VLSI Built-in Self-Test. VLSI Design 7(2): 191-201 (1998)
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