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"On-Chip Measurement System for Within-Die Delay Variation of Individual ..."

Xin Zhang et al. (2012)

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DOI: 10.1109/TVLSI.2011.2162257

access: closed

type: Journal Article

metadata version: 2020-03-11

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  - https://dblp.org/rec/journals/tvlsi/ZhangIFTS12
Xin Zhang, Koichi Ishida, Hiroshi Fuketa, Makoto Takamiya, Takayasu Sakurai:
On-Chip Measurement System for Within-Die Delay Variation of Individual Standard Cells in 65-nm CMOS. IEEE Trans. Very Large Scale Integr. Syst. 20(10): 1876-1880 (2012)

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