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"Leakage Power and Circuit Aging Cooptimization by Gate Replacement Techniques."

Yu Wang et al. (2011)

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DOI: 10.1109/TVLSI.2009.2037637

access: closed

type: Journal Article

metadata version: 2021-04-09

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  - https://dblp.org/rec/journals/tvlsi/WangCWCXY11
Yu Wang, Xiaoming Chen, Wenping Wang, Yu Cao, Yuan Xie, Huazhong Yang:
Leakage Power and Circuit Aging Cooptimization by Gate Replacement Techniques. IEEE Trans. Very Large Scale Integr. Syst. 19(4): 615-628 (2011)

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