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"Nonrandom Device Mismatch Considerations in Nanoscale SRAM."

Randy W. Mann et al. (2012)

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DOI: 10.1109/TVLSI.2011.2158863

access: closed

type: Journal Article

metadata version: 2020-03-11

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  - https://dblp.org/rec/journals/tvlsi/MannHNC12
Randy W. Mann, Terry B. Hook, Phung T. Nguyen, Benton H. Calhoun:
Nonrandom Device Mismatch Considerations in Nanoscale SRAM. IEEE Trans. Very Large Scale Integr. Syst. 20(7): 1211-1220 (2012)

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