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"Test-Point Insertion Efficiency Analysis for LBIST in High-Assurance ..."

Miao Tony He et al. (2017)

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DOI: 10.1109/TVLSI.2017.2704104

access: closed

type: Journal Article

metadata version: 2021-11-30

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  dblp key:
  - journals/tvlsi/HeCTWT17
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  persistent URL:
  - https://dblp.org/rec/journals/tvlsi/HeCTWT17
Miao Tony He, Gustavo K. Contreras, Dat Tran, LeRoy Winemberg, Mark M. Tehranipoor:
Test-Point Insertion Efficiency Analysis for LBIST in High-Assurance Applications. IEEE Trans. Very Large Scale Integr. Syst. 25(9): 2602-2615 (2017)

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