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"Built-in Loopback Test for IC RF Transceivers."

Jerzy J. Dabrowski, Rashad Ramzan (2010)

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DOI: 10.1109/TVLSI.2009.2019085

access: closed

type: Journal Article

metadata version: 2020-03-11

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Jerzy J. Dabrowski, Rashad Ramzan:
Built-in Loopback Test for IC RF Transceivers. IEEE Trans. Very Large Scale Integr. Syst. 18(6): 933-946 (2010)

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