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"Comparing the Defect Reduction Benefits of Code Inspection and Test-Driven ..."

Jerod W. Wilkerson, Jay F. Nunamaker Jr., Rick Mercer (2012)

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DOI: 10.1109/TSE.2011.46

access: closed

type: Journal Article

metadata version: 2017-05-17

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  - https://dblp.org/rec/journals/tse/WilkersonNM12
Jerod W. Wilkerson, Jay F. Nunamaker Jr., Rick Mercer:
Comparing the Defect Reduction Benefits of Code Inspection and Test-Driven Development. IEEE Trans. Software Eng. 38(3): 547-560 (2012)

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