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"Relating integrated circuit yield and time-dependent reliability for ..."

Kyungmee O. Kim (2006)

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DOI: 10.1109/TR.2006.874930

access: closed

type: Journal Article

metadata version: 2020-07-09

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Kyungmee O. Kim:
Relating integrated circuit yield and time-dependent reliability for various defect density distributions. IEEE Trans. Reliab. 55(2): 307-313 (2006)

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