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"A Bayesian Approach for One-Shot Device Testing With Exponential Lifetimes ..."

Narayanaswamy Balakrishnan, Hon Yiu So, Man Ho Ling (2016)

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DOI: 10.1109/TR.2015.2440235

access: closed

type: Journal Article

metadata version: 2020-07-09

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Narayanaswamy Balakrishnan, Hon Yiu So, Man Ho Ling:
A Bayesian Approach for One-Shot Device Testing With Exponential Lifetimes Under Competing Risks. IEEE Trans. Reliab. 65(1): 469-485 (2016)

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