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"Test compaction for small-delay defects using an effective path selection ..."
Dong Xiang et al. (2013)
- Dong Xiang, Jianbo Li, Krishnendu Chakrabarty, Xijiang Lin:
Test compaction for small-delay defects using an effective path selection scheme. ACM Trans. Design Autom. Electr. Syst. 18(3): 44:1-44:23 (2013)
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