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"SOC test architecture design for efficient utilization of test bandwidth."

Sandeep Kumar Goel, Erik Jan Marinissen (2003)

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DOI: 10.1145/944027.944029

access: closed

type: Journal Article

metadata version: 2024-02-05

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Sandeep Kumar Goel, Erik Jan Marinissen:
SOC test architecture design for efficient utilization of test bandwidth. ACM Trans. Design Autom. Electr. Syst. 8(4): 399-429 (2003)

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