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"An efficient BIST method for non-traditional faults of embedded memory arrays."

Wen-Ben Jone, Der-Cheng Huang, Sunil R. Das (2003)

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DOI: 10.1109/TIM.2003.818546

access: closed

type: Journal Article

metadata version: 2022-11-07

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Wen-Ben Jone, Der-Cheng Huang, Sunil R. Das:
An efficient BIST method for non-traditional faults of embedded memory arrays. IEEE Trans. Instrum. Meas. 52(5): 1381-1390 (2003)

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