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"Validation of Lifetime Prediction of IGBT Modules Based on Linear Damage ..."

Ui-Min Choi, Ke Ma, Frede Blaabjerg (2018)

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DOI: 10.1109/TIE.2017.2752142

access: closed

type: Journal Article

metadata version: 2023-09-26

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Ui-Min Choi, Ke Ma, Frede Blaabjerg:
Validation of Lifetime Prediction of IGBT Modules Based on Linear Damage Accumulation by Means of Superimposed Power Cycling Tests. IEEE Trans. Ind. Electron. 65(4): 3520-3529 (2018)

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