"Guest Editorial: Special Issue of ACM TECS on the ACM-IEEE International ..."

Patricia Derler, Klaus Schneider, Jean-Pierre Talpin (2019)

Details and statistics

DOI: 10.1145/3292422

access: closed

type: Journal Article

metadata version: 2020-09-08

a service of  Schloss Dagstuhl - Leibniz Center for Informatics