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"Stress-Lysis: A DNN-Integrated Edge Device for Stress Level Detection in ..."
Laavanya Rachakonda et al. (2019)
- Laavanya Rachakonda, Saraju P. Mohanty, Elias Kougianos, Prabha Sundaravadivel:
Stress-Lysis: A DNN-Integrated Edge Device for Stress Level Detection in the IoMT. IEEE Trans. Consumer Electron. 65(4): 474-483 (2019)
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