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"A Scan Cell Design for Scan-Based Debugging of an SoC With Multiple Clock ..."

Hyunbean Yi et al. (2010)

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DOI: 10.1109/TCSII.2010.2049923

access: closed

type: Journal Article

metadata version: 2020-05-27

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Hyunbean Yi, Sandip Kundu, Sangwook Cho, Sungju Park:
A Scan Cell Design for Scan-Based Debugging of an SoC With Multiple Clock Domains. IEEE Trans. Circuits Syst. II Express Briefs 57-II(7): 561-565 (2010)

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