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"Design and Evaluation of Low-Complexity Radiation Hardened CMOS Latch for ..."

Jing Guo et al. (2020)

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DOI: 10.1109/TCSI.2020.2973676

access: closed

type: Journal Article

metadata version: 2023-05-10

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Jing Guo, Shanshan Liu, Lei Zhu, Fabrizio Lombardi:
Design and Evaluation of Low-Complexity Radiation Hardened CMOS Latch for Double-Node Upset Tolerance. IEEE Trans. Circuits Syst. I Regul. Pap. 67-I(6): 1925-1935 (2020)

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