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"Flash Memory Testing and Built-In Self-Diagnosis With March-Like Test ..."

Jen-Chieh Yeh et al. (2007)

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DOI: 10.1109/TCAD.2006.885828

access: closed

type: Journal Article

metadata version: 2023-09-30

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Jen-Chieh Yeh, Kuo-Liang Cheng, Yung-Fa Chou, Cheng-Wen Wu:
Flash Memory Testing and Built-In Self-Diagnosis With March-Like Test Algorithms. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 26(6): 1101-1113 (2007)

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