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"Thermal-Aware Small-Delay Defect Testing in Integrated Circuits for ..."

Dong Xiang et al. (2016)

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DOI: 10.1109/TCAD.2015.2474365

access: closed

type: Journal Article

metadata version: 2020-09-24

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Dong Xiang, Kele Shen, Bhargab B. Bhattacharya, Xiaoqing Wen, Xijiang Lin:
Thermal-Aware Small-Delay Defect Testing in Integrated Circuits for Mitigating Overkill. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35(3): 499-512 (2016)

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