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"A Metric for Test Set Characterization and Customization Toward Fault ..."

Subhadip Kundu et al. (2013)

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DOI: 10.1109/TCAD.2013.2272538

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - https://dblp.org/rec/journals/tcad/KunduPCSK13
Subhadip Kundu, Sankhadeep Pal, Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur:
A Metric for Test Set Characterization and Customization Toward Fault Diagnosis. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 32(11): 1824-1828 (2013)

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