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"Hierarchical test generation and design for testability methods for ASPPs ..."

Indradeep Ghosh, Anand Raghunathan, Niraj K. Jha (1999)

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DOI: 10.1109/43.748165

access: closed

type: Journal Article

metadata version: 2021-10-14

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  - journals/tcad/GhoshRJ99
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  - https://dblp.org/rec/journals/tcad/GhoshRJ99
Indradeep Ghosh, Anand Raghunathan, Niraj K. Jha:
Hierarchical test generation and design for testability methods for ASPPs and ASIPs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 18(3): 357-370 (1999)

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