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"A timing-driven pseudoexhaustive testing for VLSI circuits."

Shih-Chieh Chang, Jiann-Chyi Rau (2001)

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DOI: 10.1109/43.905682

access: closed

type: Journal Article

metadata version: 2020-09-24

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Shih-Chieh Chang, Jiann-Chyi Rau:
A timing-driven pseudoexhaustive testing for VLSI circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 20(1): 147-158 (2001)

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